Search
Now showing items 1-2 of 2
IEEE 1149.7: Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture - IEEE Computer Society
Abstract: The standard will define a link between IEEE 1149.1 interfaces in Debug and Test Systems (DTS) and IEEE 1149.1 (JTAG) interfaces in Target Systems (TS). The link defined by this standard introduces an additional layer ...
IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture: IEEE Std 1149.7-2022 (Revision of IEEE Std 1149.7-2009)
Abstract: Circuitry that may be added to an integrated circuit to provide access to on-chip Test Access Ports (TAPs) specified by IEEE Std 1149.1 is described in this standard. The circuitry uses IEEE Std 1149.1 as its foundation, ...