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NASA-LLIS-1315: Lessons Learned – Increasing ESD Susceptibility of Integrated Circuits (2002)
Abstract: Abstract:
ESD susceptibility remains a pressing reliability issue in IC design due to the continually decreasing feature size and the increasing vulnerability to voltages that are much lower than human ...
ESD susceptibility remains a pressing reliability issue in IC design due to the continually decreasing feature size and the increasing vulnerability to voltages that are much lower than human ...