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French -- Dispositifs à semiconducteurs – Dispositifs à semiconducteurs souples et extensibles – Partie 6: Méthode d’essai pour la résistance de couche des couches conductrices souples - Edition 1.0|English -- Semiconductor devices – Flexible and stretchable semiconductor devices – Part 6: Test method for sheet resistance of flexible conducting films - Edition 1.0
IEC 62951-6
| contributor author | IEC - International Electrotechnical Commission | |
| date accessioned | 2020-09-15T22:28:08Z | |
| date available | 2020-09-15T22:28:08Z | |
| date copyright | 2019.05.01 | |
| date issued | 2019 | |
| identifier other | ADEWHGAAAAAAAAAA.pdf | |
| identifier other | ADEWHGAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jse/handle/yse/288963 | |
| description abstract | Scope: This part of IEC 62951 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance. | |
| language | English, French | |
| title | French -- Dispositifs à semiconducteurs – Dispositifs à semiconducteurs souples et extensibles – Partie 6: Méthode d’essai pour la résistance de couche des couches conductrices souples - Edition 1.0|English -- Semiconductor devices – Flexible and stretchable semiconductor devices – Part 6: Test method for sheet resistance of flexible conducting films - Edition 1.0 | en |
| title | IEC 62951-6 | num |
| type | standard | |
| page | 54 | |
| status | Active | |
| tree | IEC - International Electrotechnical Commission:;2019 | |
| contenttype | fulltext |
