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Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary

24/30465997 DC

contributor authorBSI - British Standards Institution
date accessioned2024-12-17T07:07:04Z
date available2024-12-17T07:07:04Z
date copyright23 January 2024
date issued2024
identifier isbn-
identifier other000000000030465997.pdf
identifier urihttp://yse.yabesh.ir/std;jse/handle/yse/336156
languageEnglish
publisherBSI - British Standards Institution
titleMicrobeam analysis — Focused ion beam application for TEM specimen preparation — Vocabularyen
title24/30465997 DCnum
typeStandard
page34
statusCurrent, Draft for public comment
treeBSI - British Standards Institution:;2024
contenttypeFulltext


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