ECA 186-11E

Passive Electronic Component Parts, Test Methods for; Method 11: Thermal Shock in Ai

contributor author	ECIA - Electronic Components Industry Association
date accessioned	2017-09-04T16:35:21Z
date available	2017-09-04T16:35:21Z
date copyright	28764
date issued	1978
identifier other	UZSRCAAAAAAAAAAA.pdf
identifier uri	http://yse.yabesh.ir/std;jse/handle/yse/98838
description abstract	PURPOSE This test is conducted for the purpose of determining the resistance of a component part to exposures at ! extremes of high and low temperatures in air, and to the shock of alternate exposures to these extremes. Permanent changes in operating characteristics and physical damage produced during thermal shock result principally from variations in dimensions and other physical properties. Effects of thermal shock include cracking and delamination of finishes, cracking and crazing of embedding and encapsulating compounds, opening of terminal seals and case seams, leakage of filling materials, and change in electrical characteristics- due to mechanical displacement or rupture of conductors or of insulating materials.
language	English
title	ECA 186-11E	num
title	Passive Electronic Component Parts, Test Methods for; Method 11: Thermal Shock in Ai	en
type	standard
page	5
status	Active
tree	ECIA - Electronic Components Industry Association:;1978
contenttype	fulltext