French -- Dispositifs à semiconducteurs – Methodes de mesure et d’evaluation des dispositifs de captage d’énergie cinétique dans un environnement de vibrations concret – Partie 1: Vibrations mécaniques arbitraires et aléatoires - Edition 1.0|English -- Semiconductor devices – Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment – Part 1: Arbitrary and random mechanical vibrations - Edition 1.0

Abstract

Scope: This part of IEC 63150 specifies terms and definitions, and test methods for kinetic energy harvesting devices for one-dimensional mechanical vibrations to determine the characteristic parameters under a practical vibration environment. Such vibration energy harvesting devices often have their own non-linear mechanisms to efficiently capture vibration energy in a broadband frequency range. This document is applicable to vibration energy harvesting devices with different power generation principles (such as electromagnetic, piezoelectric, electrostatic, etc.) and with different non-linear behaviour to the external mechanical excitation.