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IPC TM-650 2.6.3.7
Surface Insulation Resistance
| contributor author | IPC - Association Connecting Electronics Industries | |
| date accessioned | 2017-09-04T17:16:14Z | |
| date available | 2017-09-04T17:16:14Z | |
| date copyright | 03/01/2007 | |
| date issued | 2007 | |
| identifier other | ZFHVACAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jsery=autho162s7D83081DAC426159DD6EFDEC014A/handle/yse/139674 | |
| description abstract | This test method is used to quantify the deleterious effects of fabrication, process or handling residues on Surface Insulation Resistance (SIR) in the presence of moisture. The electrodes are long parallel traces (printed interdigitated comb patterns) on a standardized printed board or assembly. Samples shall be conditioned and measurements taken at a high humidity. Electrodes are electrically biased during conditioning to facilitate electrochemical reactions. Specifically, this method is designed to: • Simultaneously assess a) leakage current caused by ionized water films and b) electrochemical degradation of test vehicle, (corrosion, dendritic growth). • Provide metric(s) that can appropriately be used for binary classification (e.g., go/no go, pass/fail). • Compare, rank or characterize materials and processes. | |
| language | English | |
| title | IPC TM-650 2.6.3.7 | num |
| title | Surface Insulation Resistance | en |
| type | standard | |
| page | 4 | |
| status | Active | |
| tree | IPC - Association Connecting Electronics Industries:;2007 | |
| contenttype | fulltext |
