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ECA EIA-970
Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip Capacitors
Organization:
ECIA - Electronic Components Industry Association
Year: 2013
Abstract: This test method is used to measure the S parameters of low-inductance multilayer ceramic capacitors when mounted in shunt on a probeable low inductance test fixture.
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| contributor author | ECIA - Electronic Components Industry Association | |
| date accessioned | 2017-09-04T15:58:32Z | |
| date available | 2017-09-04T15:58:32Z | |
| date copyright | 07/01/2013 | |
| date issued | 2013 | |
| identifier other | RCWYFFAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jsery=autho4703177D081D20686159DD6EFDEC9FCDoginin/handle/yse/61658 | |
| description abstract | This test method is used to measure the S parameters of low-inductance multilayer ceramic capacitors when mounted in shunt on a probeable low inductance test fixture. | |
| language | English | |
| title | ECA EIA-970 | num |
| title | Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip Capacitors | en |
| type | standard | |
| page | 26 | |
| status | Active | |
| tree | ECIA - Electronic Components Industry Association:;2013 | |
| contenttype | fulltext |