IPC TM-650 2.3.7.1A
Cupric Chloride Etching Method
contributor author | IPC - Association Connecting Electronics Industries | |
date accessioned | 2017-09-04T18:23:01Z | |
date available | 2017-09-04T18:23:01Z | |
date copyright | 34669 | |
date issued | 1994 | |
identifier other | ICYTCAAAAAAAAAAA.pdf | |
identifier uri | http://yse.yabesh.ir/std;jsery=authoF2376596FCDCAC426159DD6E273C9FCD/handle/yse/205427 | |
description abstract | This method is a means for preparation of test specimens for determination of bare dielectric material quality and properties, using cupric chloride as the etching solution for removal of copper cladding. | |
language | English | |
title | IPC TM-650 2.3.7.1A | num |
title | Cupric Chloride Etching Method | en |
type | standard | |
page | 2 | |
status | Active | |
tree | IPC - Association Connecting Electronics Industries:;1994 | |
contenttype | fulltext |