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Passive Electronic Component Parts, Test Methods for; Method 12: Heat-Life Test

contributor authorECIA - Electronic Components Industry Association
date accessioned2017-09-04T15:46:23Z
date available2017-09-04T15:46:23Z
date copyright28764
date issued1978
identifier otherPVBUCAAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;jsessionid=190419C4AB017808E65B78A0B48BF7AE/handle/yse/49071
description abstractPURPOSE
This test is performed to determine the effect of storing or operating component parts at elevated temperatures for various time periods. Different degrees of severity as prescribed by temperature and time are available. This method should be used in conjunction wïth the pertinent component specification which will define severity.
languageEnglish
titleECA 186-12Enum
titlePassive Electronic Component Parts, Test Methods for; Method 12: Heat-Life Testen
typestandard
page4
statusActive
treeECIA - Electronic Components Industry Association:;1978
contenttypefulltext


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