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SCREENING PROCEDURE FOR A SILICON DUAL N-CHANNEL JUNCTION FIELD-EFFECT TRANSISTOR (2N5197)

contributor authorGSFC - NASA - GSFC - Robert H. Goddard Space Flight Center
date accessioned2017-09-04T17:46:42Z
date available2017-09-04T17:46:42Z
date copyright30302
date issued1982
identifier otherEMQZDAAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;jsessionid=22E9669814B1A2CD62B816A309F4CAB6/handle/yse/169866
languageEnglish
titleGSFC-S-311-113num
titleSCREENING PROCEDURE FOR A SILICON DUAL N-CHANNEL JUNCTION FIELD-EFFECT TRANSISTOR (2N5197)en
typestandard
page10
statusActive
treeGSFC - NASA - GSFC - Robert H. Goddard Space Flight Center:;1982
contenttypefulltext


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