GSFC-S-311-42
SCREENING PROCEDURE FOR A SILICON N-CHANNEL JUNCTION FIELD - EFFECT TRANSISTOR (2N4392)
Year: 1974
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contributor author | GSFC - NASA - GSFC - Robert H. Goddard Space Flight Center | |
date accessioned | 2017-09-04T17:36:52Z | |
date available | 2017-09-04T17:36:52Z | |
date copyright | 27355 | |
date issued | 1974 | |
identifier other | DLQZDAAAAAAAAAAA.pdf | |
identifier uri | http://yse.yabesh.ir/std;jsessionid=47037D83FC/handle/yse/159747 | |
language | English | |
title | GSFC-S-311-42 | num |
title | SCREENING PROCEDURE FOR A SILICON N-CHANNEL JUNCTION FIELD - EFFECT TRANSISTOR (2N4392) | en |
type | standard | |
page | 8 | |
status | Active | |
tree | GSFC - NASA - GSFC - Robert H. Goddard Space Flight Center:;1974 | |
contenttype | fulltext |