English -- Test methods for electrical materials, printed boards and other interconnection structures and assemblies – Part 5-506: General test methods for materials and assemblies – An intercomparison evaluation to implement the use of fine-pitch test structures for surface insulation resistance (SIR) testing of solder fluxes in accordance with IEC 61189-5-501 - Edition 1.0
IEC TR 61189-5-506
contributor author | IEC - International Electrotechnical Commission | |
date accessioned | 2020-09-15T22:28:38Z | |
date available | 2020-09-15T22:28:38Z | |
date copyright | 2019.06.01 | |
date issued | 2019 | |
identifier other | XJHEIGAAAAAAAAAA.pdf | |
identifier other | XJHEIGAAAAAAAAAA.pdf | |
identifier uri | http://yse.yabesh.ir/std;jsessionid=47037D83FC/handle/yse/289076 | |
description abstract | Scope: This Technical Report is an intercomparison supporting the development of IEC 61189-5-501 in relation to the SIR method. This document sets out to validate the introduction of a new 200-μm gap SIR pattern, and was benched marked against existing SIR gap patterns of 318 μm and 500 μm. | |
language | English | |
title | English -- Test methods for electrical materials, printed boards and other interconnection structures and assemblies – Part 5-506: General test methods for materials and assemblies – An intercomparison evaluation to implement the use of fine-pitch test structures for surface insulation resistance (SIR) testing of solder fluxes in accordance with IEC 61189-5-501 - Edition 1.0 | en |
title | IEC TR 61189-5-506 | num |
type | standard | |
page | 28 | |
status | Active | |
tree | IEC - International Electrotechnical Commission:;2019 | |
contenttype | fulltext |