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MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, DUAL 64-STAGE STATIC SHIFT REGISTER, MONOLITHIC SILICON

contributor authorDLA - CC - DLA Land and Maritime
date accessioned2017-09-04T18:48:23Z
date available2017-09-04T18:48:23Z
date copyright05/09/2000
date issued2000
identifier otherKOTLKAAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;jsessionid=47037D83FCDCAC426159DD6E273C9FCD/handle/yse/229679
description abstractThis drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. Intended Use: Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. Microcircuits covered by this drawing will replace the same generic device covered by a contractor prepared specification or drawing. Device class Q devices will replace device class M devices.
languageEnglish
titleSMD-5962-96668 REV Bnum
titleMICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, DUAL 64-STAGE STATIC SHIFT REGISTER, MONOLITHIC SILICONen
typestandard
page23
statusActive
treeDLA - CC - DLA Land and Maritime:;2000
contenttypefulltext


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