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IEEE Std 1241-2023 (Revision of IEEE Std 1241-2010)

contributor authorIEEE - The Institute of Electrical and Electronics Engineers, Inc.
date accessioned2024-12-17T08:08:37Z
date available2024-12-17T08:08:37Z
date copyright06 October 2023
date issued2023
identifier other10269815.pdf
identifier urihttp://yse.yabesh.ir/std;jsessionid=A33FFBB4A04818B251172099FA6814F7/handle/yse/336255
description abstractThe material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.
languageEnglish
publisherIEEE - The Institute of Electrical and Electronics Engineers, Inc.
titleIEEE Standard for Terminology and Test Methods for Analog-to-Digital Convertersen
titleIEEE Std 1241-2023 (Revision of IEEE Std 1241-2010)num
typestandard
page143
statusActive
treeIEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2023
contenttypefulltext
subject keywordssine fitting
subject keywordsLSB
subject keywordsmissing codes
subject keywordsnoise power ratio
subject keywordsIEEE 1241™
subject keywordsanalog-to-digital converter
subject keywordsquantization error
subject keywordsSAR
subject keywordsENOB
subject keywordshistogram
subject keywordsADC
subject keywordsnoncoherent sampling
subject keywordsSFDR
subject keywordsINL
subject keywordscoherent sampling
subject keywordscode transition level
subject keywordsDNL
subject keywordsquantization noise
identifier DOI10.1109/IEEESTD.2023.10269815


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