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Report on Round Robin Study to Correlate Interconnect Stress Test (IST) with Thermal Stress/Microsectioning Evaluations for Detecting the Presence of Inner-Layer Seperations

contributor authorIPC - Association Connecting Electronics Industries
date accessioned2017-09-04T18:23:05Z
date available2017-09-04T18:23:05Z
date copyright07/01/2001
date issued2001
identifier otherIDCVWAAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;jsessioutho1513AF67081D20686159DD6EFDEC014A/handle/yse/205481
description abstractThe scope of this test program includes a study of the repeatability and reproducibility of IST and thermal stress test method to determine the presence of inner-layer separations, development of guidelines for the use of IST testing and test data as a substitute for thermal stress testing in acceptance of product for shipment and to generate a report assessing all pertinent criteria of the program purpose.
languageEnglish
titleIPC TR-486num
titleReport on Round Robin Study to Correlate Interconnect Stress Test (IST) with Thermal Stress/Microsectioning Evaluations for Detecting the Presence of Inner-Layer Seperationsen
typestandard
page56
statusActive
treeIPC - Association Connecting Electronics Industries:;2001
contenttypefulltext


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