درباره ما
IEC 60749-5
English -- Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test - Edition 2.0
| contributor author | IEC - International Electrotechnical Commission | |
| date accessioned | 2017-10-18T11:08:51Z | |
| date available | 2017-10-18T11:08:51Z | |
| date copyright | 2017.04.01 | |
| date issued | 2017 | |
| identifier other | VYAPYFAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;quessioutho4703177793325273135A68A10958014A0F/handle/yse/235587 | |
| description abstract | Scope: This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. This test method is considered destructive. | |
| language | English | |
| title | IEC 60749-5 | num |
| title | English -- Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test - Edition 2.0 | en |
| type | standard | |
| page | 14 | |
| status | Active | |
| tree | IEC - International Electrotechnical Commission:;2017 | |
| contenttype | fulltext |
