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IEC 62276
English -- Single crystal wafers for surface acoustic wave (SAW) device applications ? Specifications and measuring methods - Edition 3.0
| contributor author | IEC - International Electrotechnical Commission | |
| date accessioned | 2017-10-18T11:09:14Z | |
| date available | 2017-10-18T11:09:14Z | |
| date copyright | 2016.10.01 | |
| date issued | 2016 | |
| identifier other | WJOMSFAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jsessiouthor:%22NAVY%20-%20YD%20-/handle/yse/235687 | |
| description abstract | Scope: This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. | |
| language | English | |
| title | IEC 62276 | num |
| title | English -- Single crystal wafers for surface acoustic wave (SAW) device applications ? Specifications and measuring methods - Edition 3.0 | en |
| type | standard | |
| page | 44 | |
| status | Active | |
| tree | IEC - International Electrotechnical Commission:;2016 | |
| contenttype | fulltext |
