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IEC 62899-402-1
English -- Printed electronics - Part 402-1: Printability - Measurement of qualities - Pattern width - Edition 1.0
| contributor author | IEC - International Electrotechnical Commission | |
| date accessioned | 2017-10-18T11:09:42Z | |
| date available | 2017-10-18T11:09:42Z | |
| date copyright | 2017.03.01 | |
| date issued | 2017 | |
| identifier other | WZICYFAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jsessiouthor:%22NAVY%20-%20YD%20-/handle/yse/235805 | |
| description abstract | Scope: This part of IEC 62899 specifies the measurement methods of the widths of the printed patterns in printed electronics. These printed pattern widths are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for thickness in printed electronics. | |
| language | English | |
| title | IEC 62899-402-1 | num |
| title | English -- Printed electronics - Part 402-1: Printability - Measurement of qualities - Pattern width - Edition 1.0 | en |
| type | standard | |
| page | 16 | |
| status | Active | |
| tree | IEC - International Electrotechnical Commission:;2017 | |
| contenttype | fulltext |
