درباره ما
IEC 62435-2
English -- Electronic components ? Long-term storage of electronic semiconductor devices ? Part 2: Deterioration mechanisms - Edition 1.0;
French -- Composants ‚lectroniques ? Stockage de longue dur‚e des dispositifs ‚lectroniques … semiconducteurs ? Partie 2: M‚canismes de d‚t‚rioration - Edition 1.0
| contributor author | IEC - International Electrotechnical Commission | |
| date accessioned | 2017-10-18T11:10:40Z | |
| date available | 2017-10-18T11:10:40Z | |
| date copyright | 2017.01.01 | |
| date issued | 2017 | |
| identifier other | YCOQTFAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jsessiouthor:%22NAVY%20-%20YD%20-/handle/yse/236031 | |
| description abstract | Scope: This part of IEC 62435 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with IEC 62435-1 for any device longterm storage whose duration may be more than 12 months for product scheduled for long duration storage. Mechanisms that apply to specific component types are detailed in IEC 62435-5 to IEC 62435-9 (proposed)1. | |
| language | English, French | |
| title | IEC 62435-2 | num |
| title | English -- Electronic components ? Long-term storage of electronic semiconductor devices ? Part 2: Deterioration mechanisms - Edition 1.0 | en |
| title | French -- Composants ‚lectroniques ? Stockage de longue dur‚e des dispositifs ‚lectroniques … semiconducteurs ? Partie 2: M‚canismes de d‚t‚rioration - Edition 1.0 | other |
| type | standard | |
| page | 40 | |
| status | Active | |
| tree | IEC - International Electrotechnical Commission:;2017 | |
| contenttype | fulltext |
