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IEC TS 61586
English -- Estimation of the reliability of electrical connectors - Edition 2.0;
French -- Estimation de la fiabilit‚ des connecteurs ‚lectriques - Edition 2.0
| contributor author | IEC - International Electrotechnical Commission | |
| date accessioned | 2017-10-18T11:12:18Z | |
| date available | 2017-10-18T11:12:18Z | |
| date copyright | 2017.01.01 | |
| date issued | 2017 | |
| identifier other | CQNHUFAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jsessiouthor:%22NAVY%20-%20YD%20-/handle/yse/236412 | |
| description abstract | Scope: This technical specification deals with the estimation of the inherent design reliability of electrical connectors through the definition and development of an appropriate accelerated testing programme. The basic intrinsic degradation mechanisms of connectors, which are those mechanisms which exist as a result of the materials and geometries chosen for the connector design, are reviewed to provide a context for the development of the desired test programme. While extrinsic degradation mechanisms may also significantly affect the performance of connectors, they vary widely by application and thus are not addressed in this document. | |
| language | English, French | |
| title | IEC TS 61586 | num |
| title | English -- Estimation of the reliability of electrical connectors - Edition 2.0 | en |
| title | French -- Estimation de la fiabilit‚ des connecteurs ‚lectriques - Edition 2.0 | other |
| type | standard | |
| page | 60 | |
| status | Active | |
| tree | IEC - International Electrotechnical Commission:;2017 | |
| contenttype | fulltext |
