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IEC 60749-13
|French -- Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 13: Atmosphère saline - Edition 2.0Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere - Edition 2.0
| contributor author | IEC - International Electrotechnical Commission | |
| date accessioned | 2018-07-31T09:57:51Z | |
| date available | 2018-07-31T09:57:51Z | |
| date copyright | 2018.02.01 | |
| date issued | 2018 | |
| identifier other | DEXADGAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jsessiouthor:%22NAVY%20-%20YD%20-/handle/yse/264233 | |
| description abstract | This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. | |
| language | English | |
| language | French | |
| title | IEC 60749-13 | num |
| title | |French -- Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 13: Atmosphère saline - Edition 2.0Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere - Edition 2.0 | en |
| type | standard | |
| page | 32 | |
| status | Active | |
| tree | IEC - International Electrotechnical Commission:;2018 | |
| contenttype | fulltext |
