درباره ما
IEC TR 63133
Semiconductor devices - Scan based ageing level estimation for semiconductor devices - Edition 1.0
| contributor author | IEC - International Electrotechnical Commission | |
| date accessioned | 2018-07-31T09:58:09Z | |
| date available | 2018-07-31T09:58:09Z | |
| date copyright | 2017.10.01 | |
| date issued | 2017 | |
| identifier other | ISEQCGAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jsessiouthor:%22NAVY%20-%20YD%20-/handle/yse/264407 | |
| description abstract | This Technical Report specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system. | |
| language | English | |
| title | IEC TR 63133 | num |
| title | Semiconductor devices - Scan based ageing level estimation for semiconductor devices - Edition 1.0 | en |
| type | standard | |
| page | 22 | |
| status | Active | |
| tree | IEC - International Electrotechnical Commission:;2017 | |
| contenttype | fulltext |
