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IEC 62884-3

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 3: Frequency aging test methods - Edition 1.0

Organization:
IEC - International Electrotechnical Commission
Year: 2018

Abstract: This part of IEC 62884 describes the methods for the measurement and evaluation of frequency aging tests of piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"). The purpose of those tests is to provide statistical data supporting aging predictions.
URI: http://yse.yabesh.ir/std;jsessiouthor:%22NAVY%20-%20YD%20-/handle/yse/264683
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    IEC 62884-3

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contributor authorIEC - International Electrotechnical Commission
date accessioned2018-07-31T09:58:35Z
date available2018-07-31T09:58:35Z
date copyright2018.03.01
date issued2018
identifier otherRLOXEGAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;jsessiouthor:%22NAVY%20-%20YD%20-/handle/yse/264683
description abstractThis part of IEC 62884 describes the methods for the measurement and evaluation of frequency aging tests of piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"). The purpose of those tests is to provide statistical data supporting aging predictions.
languageEnglish
titleIEC 62884-3num
titleMeasurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 3: Frequency aging test methods - Edition 1.0en
typestandard
page18
statusActive
treeIEC - International Electrotechnical Commission:;2018
contenttypefulltext
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