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IEC 60749-12
|French -- Dispositifs à semiconducteurs – Méthodes d’essais mécaniques et climatiques – Partie 12: Vibrations, fréquences variables - Edition 2.0Semiconductor devices – Mechanical and climatic test methods – Part 12: Vibration, variable frequency - Editi
| contributor author | IEC - International Electrotechnical Commission | |
| date accessioned | 2018-07-31T09:58:40Z | |
| date available | 2018-07-31T09:58:40Z | |
| date copyright | 2017.12.01 | |
| date issued | 2017 | |
| identifier other | TUKWCGAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;quessionid=31064A12890E9/handle/yse/264754 | |
| description abstract | This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages. NOTE This test method describes a swept sine test. A random vibration test is described in JEDEC document JESD 22-B103. | |
| language | English | |
| language | French | |
| title | IEC 60749-12 | num |
| title | |French -- Dispositifs à semiconducteurs – Méthodes d’essais mécaniques et climatiques – Partie 12: Vibrations, fréquences variables - Edition 2.0Semiconductor devices – Mechanical and climatic test methods – Part 12: Vibration, variable frequency - Editi | en |
| type | standard | |
| page | 18 | |
| status | Active | |
| tree | IEC - International Electrotechnical Commission:;2017 | |
| contenttype | fulltext |
