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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 2: Phase jitter measurement method - Edition 1.0

contributor authorIEC - International Electrotechnical Commission
date accessioned2018-07-31T09:58:48Z
date available2018-07-31T09:58:48Z
date copyright2017.08.01
date issued2017
identifier otherWKYBCGAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;jsessiouthor:%22NAVY%20-%20YD%20-/handle/yse/264828
description abstractThis part of IEC 62884 specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter. In the measurement method, phase noise measurement equipment or a phase noise measurement system is used. NOTE Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.
languageEnglish
titleIEC 62884-2num
titleMeasurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 2: Phase jitter measurement method - Edition 1.0en
typestandard
page28
statusActive
treeIEC - International Electrotechnical Commission:;2017
contenttypefulltext


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