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<dc:date>2026-03-16T23:44:21Z</dc:date>
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<title>IEEE Recommended Practice for Use of an Unmanned Aerial Vehicle for Substation Inspection</title>
<link>https://yse.yabesh.ir/std/handle/yse/348607</link>
<description>IEEE Recommended Practice for Use of an Unmanned Aerial Vehicle for Substation Inspection; IEEE Std 3327-2025
IEEE - The Institute of Electrical and Electronics Engineers, Inc.
Described in this document is the recommended use method of unmanned aerial vehicle (UAV) for substation inspection. The composition and technical conditions of a UAV inspection system, inspection objects and methods, inspection operation methods, inspection data processing, and UAV maintenance are introduced. This method is applicable to the use of UAVs that inspect and test substation equipment and the surrounding environment.
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<dc:date>2025-01-01T00:00:00Z</dc:date>
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<title>IEEE Standard Definitions for AC (52 kV and below) and DC (3.2 kV and below) Switchgear Assemblies</title>
<link>https://yse.yabesh.ir/std/handle/yse/348608</link>
<description>IEEE Standard Definitions for AC (52 kV and below) and DC (3.2 kV and below) Switchgear Assemblies; IEEE Std C37.20.10-2024 (Revision of IEEE Std C37.20.10-2016)
IEEE - The Institute of Electrical and Electronics Engineers, Inc.
Terms and definitions encompassing products within the scope of ac (48.3 kV and below for air insulated equipment, 52 kV and below for gas insulated equipment) and dc (3.2 kV and below) power switchgear assemblies, including components for switching, interrupting, metering, protection, and regulating purposes as used primarily in connection with generation, transmission, distribution, and conversion of electric power are included in this standard.
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<dc:date>2025-01-01T00:00:00Z</dc:date>
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<title>IEEE Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments</title>
<link>https://yse.yabesh.ir/std/handle/yse/348609</link>
<description>IEEE Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments; IEEE Std 1450.1-2025 (Revision of IEEE Std 1450.1-2005)
IEEE - The Institute of Electrical and Electronics Engineers, Inc.
An interface between digital test generation tools and test equipment is provided by Standard Test Interface Language (STIL). Extensions to the test interface language (contained in this standard) are defined that facilitate the use of the language in the design environment and facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.
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<dc:date>2025-01-01T00:00:00Z</dc:date>
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<title>IEEE Standard for User Interface Requirements in Communications-Based Train Control (CBTC) Systems</title>
<link>https://yse.yabesh.ir/std/handle/yse/348602</link>
<description>IEEE Standard for User Interface Requirements in Communications-Based Train Control (CBTC) Systems; IEEE Std 1474.2-2025 (Revision of IEEE Std 1474.2-2003)
IEEE - The Institute of Electrical and Electronics Engineers, Inc.
User interface requirements for communications-based train control (CBTC) subsystems are established in this standard
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<dc:date>2025-01-01T00:00:00Z</dc:date>
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