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Information Requirements for the Qualification of Silicon Devices

contributor authorJEDEC - Solid State Technology Association
date accessioned2017-09-04T15:28:55Z
date available2017-09-04T15:28:55Z
date copyright39356
date issued2007
identifier otherNWCDBCAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;quein=autho123393FD081DAC4/handle/yse/30129
description abstractThis standard establishes the information required by semiconductor users from IC manufacturers and distributors in order to judge whether a semiconductor component is fit for use in their particular application. It establishes a set of data elements that describes the component and defines what each element means. It does not define the quality and reliability requirements that the component must satisfy. This standard can be used in conjunction with other reliability qualification standards, such as JESD34 'Failure Mechanism-Driven Reliability Qualification of Silicon Devices' and JESD47 'Stress Test Driven Qualification of Integrated Circuits'.
languageEnglish
titleJEDEC JESD69Bnum
titleInformation Requirements for the Qualification of Silicon Devicesen
typestandard
page14
statusActive
treeJEDEC - Solid State Technology Association:;2007
contenttypefulltext
subject keywordsInformation Requirements - Qualification of Silicon Devices
subject keywordsQualification of Silicon Devices


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