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BSI BS QC 790101
English -- Semiconductor Devices. Integrated Circuits. Sectional Specification for Semiconductor Integrated Circuits Excluding Hybrid Circuits Section 1: Internal Visual Examination for Semiconductor Integrated Circuits Excluding Hybrid Circuits<br>German -- Halbleiterbauelemente. Integrierte Schaltungen. Interne Sichtpruefung vor dem Verschliessen von integrierten Halbleiterschaltungen mit Ausnahme von Hybr;
French -- Dispositifs a semiconducteurs. Circuits integres. Examen visuel interen pour les circuits integres a semiconducteurs a l'exclusion des circuits hybrides<br>idschaltungen
Organization:
BSI - British Standards Institution
Year: 1992
Abstract: Tests to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.
Subject: Approval testing
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BSI BS QC 790101
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| contributor author | BSI - British Standards Institution | |
| date accessioned | 2017-09-04T16:53:52Z | |
| date available | 2017-09-04T16:53:52Z | |
| date copyright | 1992.08.15 | |
| date issued | 1992 | |
| identifier other | WWZUCAAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jsery=autho4703177D081D20686159DD6EFDEC9FCD/handle/yse/117351 | |
| description abstract | Tests to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification. | |
| language | English | |
| title | BSI BS QC 790101 | num |
| title | English -- Semiconductor Devices. Integrated Circuits. Sectional Specification for Semiconductor Integrated Circuits Excluding Hybrid Circuits Section 1: Internal Visual Examination for Semiconductor Integrated Circuits Excluding Hybrid Circuits German -- Halbleiterbauelemente. Integrierte Schaltungen. Interne Sichtpruefung vor dem Verschliessen von integrierten Halbleiterschaltungen mit Ausnahme von Hybr | en |
| title | French -- Dispositifs a semiconducteurs. Circuits integres. Examen visuel interen pour les circuits integres a semiconducteurs a l'exclusion des circuits hybrides idschaltungen | other |
| type | standard | |
| page | 32 | |
| status | Active | |
| tree | BSI - British Standards Institution:;1992 | |
| contenttype | fulltext | |
| subject keywords | Approval testing | |
| subject keywords | Assessed quality | |
| subject keywords | Defects | |
| subject keywords | Electronic equipment and components | |
| subject keywords | Inspection | |
| subject keywords | Integrated circuits | |
| subject keywords | Internal | |
| subject keywords | Qualification approval | |
| subject keywords | Quality assurance systems | |
| subject keywords | Semiconductor devices | |
| subject keywords | Semiconductor resistors | |
| subject keywords | Specification (approval) | |
| subject keywords | Testing conditions | |
| subject keywords | Visual inspection (testing) |
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