Show simple item record

SCREENING PROCEDURE FOR A SILICON DUAL N-CHANNEL JUNCTION FIELD - EFFECT TRANSISTOR (2N5196)

contributor authorGSFC - NASA - GSFC - Robert H. Goddard Space Flight Center
date accessioned2017-09-04T17:26:57Z
date available2017-09-04T17:26:57Z
date copyright27339
date issued1974
identifier otherCLQZDAAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;query=autho/handle/yse/150074
languageEnglish
titleGSFC-S-311-41num
titleSCREENING PROCEDURE FOR A SILICON DUAL N-CHANNEL JUNCTION FIELD - EFFECT TRANSISTOR (2N5196)en
typestandard
page7
statusActive
treeGSFC - NASA - GSFC - Robert H. Goddard Space Flight Center:;1974
contenttypefulltext


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record