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SCREENING PROCEDURE FOR A SILICON N-CHANNEL JUNCTION FIELD - EFFECT TRANSISTOR (2N4392)

contributor authorGSFC - NASA - GSFC - Robert H. Goddard Space Flight Center
date accessioned2017-09-04T17:36:52Z
date available2017-09-04T17:36:52Z
date copyright27355
date issued1974
identifier otherDLQZDAAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;query=autho1626AF679D4052736159DD6EFDEC014A/handle/yse/159747
languageEnglish
titleGSFC-S-311-42num
titleSCREENING PROCEDURE FOR A SILICON N-CHANNEL JUNCTION FIELD - EFFECT TRANSISTOR (2N4392)en
typestandard
page8
statusActive
treeGSFC - NASA - GSFC - Robert H. Goddard Space Flight Center:;1974
contenttypefulltext


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