GSFC-S-311-214

SCREENING PROCEDURE FOR MICROCIRCUIT PART NO. OP-207AY/883 (OP-AMP, MATCHED, LOW VOS PIN DIP)

contributor author	GSFC - NASA - GSFC - Robert H. Goddard Space Flight Center
date accessioned	2017-09-04T18:29:08Z
date available	2017-09-04T18:29:08Z
date copyright	09/27/1983
date issued	1983
identifier other	ISRZDAAAAAAAAAAA.pdf
identifier uri	http://yse.yabesh.ir/std;query=autho1216AF679D40AC4261598F1EFDEC014A/handle/yse/211353
language	English
title	GSFC-S-311-214	num
title	SCREENING PROCEDURE FOR MICROCIRCUIT PART NO. OP-207AY/883 (OP-AMP, MATCHED, LOW VOS PIN DIP)	en
type	standard
page	10
status	Active
tree	GSFC - NASA - GSFC - Robert H. Goddard Space Flight Center:;1983
contenttype	fulltext