JEDEC JEP121A

Requirements for Microelectronic Screening and Test Optimization

contributor author	JEDEC - Solid State Technology Association
date accessioned	2017-09-04T17:11:33Z
date available	2017-09-04T17:11:33Z
date copyright	38991
date issued	2006
identifier other	YSWSJBAAAAAAAAAA.pdf
identifier uri	http://yse.yabesh.ir/std;query=autho1513AF679D40AC4/handle/yse/135088
description abstract	The purpose of this document provides the basis for the optimization of 100{}creening/stress operations and sample inspection test activities. This document is designed to assist the manufacturer in optimizing the test flow while maintaining and/or improving assurance of providing high quality and reliable product in an efficient manner. This will allow for optimization of testing that is not adding value, hence, reducing cycle time and costs.
language	English
title	JEDEC JEP121A	num
title	Requirements for Microelectronic Screening and Test Optimization	en
type	standard
page	36
status	Active
tree	JEDEC - Solid State Technology Association:;2006
contenttype	fulltext
subject keywords	MIL-STD-883
subject keywords	Optimization
subject keywords	QCI Optimization
subject keywords	Screening