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IEEE Std 2870-2022

contributor authorIEEE - The Institute of Electrical and Electronics Engineers, Inc.
date accessioned2022-07-04T20:40:06Z
date available2022-07-04T20:40:06Z
date copyright31 March 2022
date issued2022
identifier other9744534.pdf
identifier urihttp://yse.yabesh.ir/std;query=autho162s6596FCDCAC4261590-%20Naval%20/handle/yse/312697
description abstractIntroduced in this guide is the grip test method for fittings of high-temperature, low-sag overhead conductor with long-term operating temperature of between 90 °C and 250 °C in the coeffect of the tension and the current.
languageEnglish
titleIEEE Guide for Grip Test Method for Fittings of High-Temperature, Low-Sag Overhead Conductor Under Tension and Electric Current Co-Effecten
titleIEEE Std 2870-2022num
typeStandard
page25
treeIEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2022
contenttypeFulltext
subject keywordsgrip strength
subject keywordstest
subject keywordsIEEE 2870
subject keywordstension
subject keywordscurrent
subject keywordshigh-temperature low-sag overhead conductor
identifier DOI10.1109/IEEESTD.2022.9744534


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