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Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test

BS EN IEC 60749-5:2024

contributor authorBSI - British Standards Institution
date accessioned2024-12-17T07:06:01Z
date available2024-12-17T07:06:01Z
date copyright06 February 2024
date issued2024
identifier isbn978 0 539 23216 5
identifier other000000000030459249.pdf
identifier urihttp://yse.yabesh.ir/std;query=autho162s6596FCDCAC426159DD6EFDEC9FCD/handle/yse/335985
languageEnglish
publisherBSI - British Standards Institution
titleSemiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life testen
titleBS EN IEC 60749-5:2024num
typeStandard
page14
statusCurrent
treeBSI - British Standards Institution:;2024
contenttypeFulltext


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