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Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

BS ISO 18118:2024

contributor authorBSI - British Standards Institution
date accessioned2024-12-17T07:06:21Z
date available2024-12-17T07:06:21Z
date copyright04 March 2024
date issued2024
identifier isbn978 0 539 23627 9
identifier other000000000030461295.pdf
identifier urihttp://yse.yabesh.ir/std;query=autho162s6596FCDCAC426159DD6EFDEC9FCD/handle/yse/336036
languageEnglish
publisherBSI - British Standards Institution
titleSurface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materialsen
titleBS ISO 18118:2024num
typeStandard
page32
statusCurrent
treeBSI - British Standards Institution:;2024
contenttypeFulltext


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