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IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
IEEE Std 1450-2023 (Revision of IEEE Std 1450-1999)
Year: 2024
IEEE - The Institute of Electrical and Electronics Engineers, Inc.
Abstract: Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined in this standard that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.
Subject: automatic test pattern generator
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IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
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| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2024-12-17T08:47:23Z | |
| date available | 2024-12-17T08:47:23Z | |
| date copyright | 24 April 2024 | |
| date issued | 2024 | |
| identifier other | 10507776.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jsein/handle/yse/336473 | |
| description abstract | Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined in this standard that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests. | |
| language | English | |
| publisher | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| title | IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data | en |
| title | IEEE Std 1450-2023 (Revision of IEEE Std 1450-1999) | num |
| type | standard | |
| page | 147 | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2024 | |
| contenttype | fulltext | |
| subject keywords | automatic test pattern generator | |
| subject keywords | structural vectors | |
| subject keywords | timed event | |
| subject keywords | built-in self-test | |
| subject keywords | cyclize | |
| subject keywords | DUT | |
| subject keywords | waveform | |
| subject keywords | pattern | |
| subject keywords | signal | |
| subject keywords | IEEE 1450™ | |
| subject keywords | CAE | |
| subject keywords | device under test | |
| subject keywords | waveshape | |
| subject keywords | ATPG | |
| subject keywords | event | |
| subject keywords | BIST | |
| subject keywords | functional vectors | |
| subject keywords | digital test vectors | |
| subject keywords | computer-aided engineering | |
| subject keywords | scan vectors | |
| identifier DOI | 10.1109/IEEESTD.2024.10507776 |