IPC TM-650 2.4.41.1A
Coefficient of Thermal Expansion by the Vitreous Silica (Quartz) Dilatometer Method
| contributor author | IPC - Association Connecting Electronics Industries | |
| date accessioned | 2017-09-04T17:16:59Z | |
| date available | 2017-09-04T17:16:59Z | |
| date copyright | 08/01/1997 | |
| date issued | 1997 | |
| identifier other | ZHGADAAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;query=autho18267D83FCDCAC6/handle/yse/140408 | |
| description abstract | To describe the vitreous silica dilatometer method for determining the linear thermal expansion of laminated materials within the temperature range of –55°C to 100°C. Inorganic substrates (non-laminated) shall be tested within a range of –55° to 150°C. | |
| language | English | |
| title | IPC TM-650 2.4.41.1A | num |
| title | Coefficient of Thermal Expansion by the Vitreous Silica (Quartz) Dilatometer Method | en |
| type | standard | |
| page | 3 | |
| status | Active | |
| tree | IPC - Association Connecting Electronics Industries:;1997 | |
| contenttype | fulltext |

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