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Plated Through Hole Structure Evaluation

contributor authorIPC - Association Connecting Electronics Industries
date accessioned2017-09-04T16:35:40Z
date available2017-09-04T16:35:40Z
date copyright08/01/1976
date issued1976
identifier otherVATSCAAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;query=autho18267D83FCDCAC6/handle/yse/99180
description abstractAfter selective chemical removal of the glassepoxy from around the through hole and its associated circuitry, an examination can be made with a microscope of the plated-through hole (PTH), pad, and conductor at any angle.
languageEnglish
titleIPC TM-650 2.1.3Anum
titlePlated Through Hole Structure Evaluationen
typestandard
page1
statusActive
treeIPC - Association Connecting Electronics Industries:;1976
contenttypefulltext


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