درباره ما
GSFC-S-311-372
SCREENING PROCEDURE FOR MICROCIRCUIT, HIGH TEMPERATURE SAMPLE AND MOLD AMPLIFIER PART NO. HA-1-2420-8
| contributor author | GSFC - NASA - GSFC - Robert H. Goddard Space Flight Center | |
| date accessioned | 2017-09-04T17:08:37Z | |
| date available | 2017-09-04T17:08:37Z | |
| date copyright | 31045 | |
| date issued | 1984 | |
| identifier other | YKSZDAAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;query=autho182693FDFCDC527318547A00FDEC014A/handle/yse/132094 | |
| language | English | |
| title | GSFC-S-311-372 | num |
| title | SCREENING PROCEDURE FOR MICROCIRCUIT, HIGH TEMPERATURE SAMPLE AND MOLD AMPLIFIER PART NO. HA-1-2420-8 | en |
| type | standard | |
| page | 7 | |
| status | Active | |
| tree | GSFC - NASA - GSFC - Robert H. Goddard Space Flight Center:;1984 | |
| contenttype | fulltext |
