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JEDEC JESD24-10
Test Method for Measurement of Reverse Recovery Time trr for Power MOSFET Drain-Source Diodes - Addendum to JEDEC JESD 24
| contributor author | JEDEC - Solid State Technology Association | |
| date accessioned | 2017-09-04T17:46:20Z | |
| date available | 2017-09-04T17:46:20Z | |
| date copyright | 08/01/1994 (R 2002) | |
| date issued | 2002 | |
| identifier other | ELTZJBAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;query=autho1826AF679D/handle/yse/169557 | |
| description abstract | Test method to measure the reverse recovery characteristics of the drain source diode of a power MOSFET. | |
| language | English | |
| title | JEDEC JESD24-10 | num |
| title | Test Method for Measurement of Reverse Recovery Time trr for Power MOSFET Drain-Source Diodes - Addendum to JEDEC JESD 24 | en |
| type | standard | |
| page | 12 | |
| status | Active | |
| tree | JEDEC - Solid State Technology Association:;2002 | |
| contenttype | fulltext | |
| subject keywords | Drain-Source Diodes | |
| subject keywords | Measurement - Reverse Recovery Time (trr) | |
| subject keywords | Power MOSFET Drain-Source Diodes | |
| subject keywords | Reverse Recovery Time - Measurement of | |
| subject keywords | Test Method - Power MOSFET Drain-Source Diodes |
