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JEDEC JESD22-A101C
Steady State Temperature Humidity Bias Life Test
| contributor author | JEDEC - Solid State Technology Association | |
| date accessioned | 2017-09-04T15:08:40Z | |
| date available | 2017-09-04T15:08:40Z | |
| date copyright | 03/01/2009 | |
| date issued | 2009 | |
| identifier other | LLPOLCAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;query=autho1826AF679D/handle/yse/6561 | |
| description abstract | This standard establishes a defined method and conditions for performing a temperature humidity life test with bias applied. The test is used to evaluate the reliability of non-hermetic packaged solid state devices in humid environments. It employs high temperature and humidity conditions to accelerate the penetration of moisture through external protective material or along interfaces between the external protective coating and conductors or other features which pass through it. This revision enhances the ability to perform this test on a device which cannot be biased to achieve very low power dissipation. | |
| language | English | |
| title | JEDEC JESD22-A101C | num |
| title | Steady State Temperature Humidity Bias Life Test | en |
| type | standard | |
| page | 6 | |
| status | Active | |
| tree | JEDEC - Solid State Technology Association:;2009 | |
| contenttype | fulltext | |
| subject keywords | Bias Life | |
| subject keywords | Life Test | |
| subject keywords | Temperature Humidity | |
| subject keywords | Test Method - Humidity Bias Life | |
| subject keywords | THB |
