GSFC-S-311-41
SCREENING PROCEDURE FOR A SILICON DUAL N-CHANNEL JUNCTION FIELD - EFFECT TRANSISTOR (2N5196)
Year: 1974
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contributor author | GSFC - NASA - GSFC - Robert H. Goddard Space Flight Center | |
date accessioned | 2017-09-04T17:26:57Z | |
date available | 2017-09-04T17:26:57Z | |
date copyright | 27339 | |
date issued | 1974 | |
identifier other | CLQZDAAAAAAAAAAA.pdf | |
identifier uri | http://yse.yabesh.ir/std;query=autho1513AF679D40AC4261598F1EFDEC014A/handle/yse/150074 | |
language | English | |
title | GSFC-S-311-41 | num |
title | SCREENING PROCEDURE FOR A SILICON DUAL N-CHANNEL JUNCTION FIELD - EFFECT TRANSISTOR (2N5196) | en |
type | standard | |
page | 7 | |
status | Active | |
tree | GSFC - NASA - GSFC - Robert H. Goddard Space Flight Center:;1974 | |
contenttype | fulltext |