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GSFC-S-311-41
SCREENING PROCEDURE FOR A SILICON DUAL N-CHANNEL JUNCTION FIELD - EFFECT TRANSISTOR (2N5196)
Year: 1974
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| contributor author | GSFC - NASA - GSFC - Robert H. Goddard Space Flight Center | |
| date accessioned | 2017-09-04T17:26:57Z | |
| date available | 2017-09-04T17:26:57Z | |
| date copyright | 27339 | |
| date issued | 1974 | |
| identifier other | CLQZDAAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;query=autho1826AF679D40527369727A00D52FAB6A/handle/yse/150074 | |
| language | English | |
| title | GSFC-S-311-41 | num |
| title | SCREENING PROCEDURE FOR A SILICON DUAL N-CHANNEL JUNCTION FIELD - EFFECT TRANSISTOR (2N5196) | en |
| type | standard | |
| page | 7 | |
| status | Active | |
| tree | GSFC - NASA - GSFC - Robert H. Goddard Space Flight Center:;1974 | |
| contenttype | fulltext |