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IEC 63011-2

contributor authorIEC - International Electrotechnical Commission
date accessioned2020-09-15T22:28:36Z
date available2020-09-15T22:28:36Z
date copyright2018.11.01
date issued2018
identifier otherXFGOGGAAAAAAAAAA.pdf
identifier otherXFGOGGAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;query=autho1826AF679D40527369727A00D52FAB6A0Facilities%20Engineering%20Command%226EFDEC9FCD/handle/yse/289072
description abstractScope: This part of IEC 63011 provides specifications of initial alignment and alignment maintenance between multiple stacked integrated circuits during the die bonding process. These specifications define the alignment keys and operating procedures of the keys. These specifications apply only if electrical coupling method of die-to-die alignment is used in the die stacking.
languageEnglish, French
titleFrench -- Circuits intégrés – Circuits intégrés tridimensionnels – Partie 2: Alignement de puces empilées à petits pas d'interconnexion - Edition 1.0|English -- Integrated circuits – Three dimensional integrated circuits – Part 2: Alignment of stacked dies having fine pitch interconnect - Edition 1.0en
titleIEC 63011-2num
typestandard
page32
statusActive
treeIEC - International Electrotechnical Commission:;2018
contenttypefulltext


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