TIA TIA-455-106

FOTP 106 Procedures for Determining Threshold Current of Semiconductor Lasers - ANSI APPROVAL WITHDRAWN JUNE 2003

contributor author	TIA - Telecommunications Industry Association
date accessioned	2017-09-04T17:57:54Z
date available	2017-09-04T17:57:54Z
date copyright	33909
date issued	1992
identifier other	FPZZIAAAAAAAAAAA.pdf
identifier uri	http://yse.yabesh.ir/std;query=autho1826AF67FCDCAC426159DD6EFDEC9FCD0Facilities%20En/handle/yse/180976
description abstract	This test covers the wavelength range from 600 nanometers to 1700 nanometers using a spectrophotometer capable of generating visible and near-infrared light. This method covers primary, secondary, and single coatings (e.g., acrylate, polyimide, and silicone), as well as pigmented coatings, that can be prepared in film specimens.
language	English
title	TIA TIA-455-106	num
title	FOTP 106 Procedures for Determining Threshold Current of Semiconductor Lasers - ANSI APPROVAL WITHDRAWN JUNE 2003	en
type	standard
page	23
status	Active
tree	TIA - Telecommunications Industry Association:;1992
contenttype	fulltext