JEDEC JESD6

Measurement of Small Values of Transistor Capacitance

contributor author	JEDEC - Solid State Technology Association
date accessioned	2017-09-04T15:13:27Z
date available	2017-09-04T15:13:27Z
date copyright	02/01/1967 (R 1981)(R 1999)(R 2002)
date issued	2002
identifier other	MAJBKBAAAAAAAAAA.pdf
identifier uri	http://yse.yabesh.ir/std;query=autho4703177/handle/yse/12160
description abstract	This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance.
language	English
title	JEDEC JESD6	num
title	Measurement of Small Values of Transistor Capacitance	en
type	standard
page	17
status	Active
tree	JEDEC - Solid State Technology Association:;2002
contenttype	fulltext
subject keywords	Capacitance - Transistor
subject keywords	Measurement - Small Value Transistor Capacitance
subject keywords	Small Values - Transistor Capacitance
subject keywords	Transistor - Capacitance