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JEDEC JESD659B
Failure-Mechanism-Driven Reliability Monitoring
| contributor author | JEDEC - Solid State Technology Association | |
| date accessioned | 2017-09-04T15:37:49Z | |
| date available | 2017-09-04T15:37:49Z | |
| date copyright | 02/01/2007 | |
| date issued | 2007 | |
| identifier other | OWDOYBAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;query=autho4703177/handle/yse/39762 | |
| description abstract | This method establishes requirements for application of Statistical Reliability Monitoring 'SRM' technology to monitor and improve the reliability of electronic components and subassemblies. The standard also describes the condition under with a monitor may be replaced or eliminated. Formerly known as EIA-659, that superseded JESD29-A (July 1996). Became JESD625-A after revision, September 1999. | |
| language | English | |
| title | JEDEC JESD659B | num |
| title | Failure-Mechanism-Driven Reliability Monitoring | en |
| type | standard | |
| page | 16 | |
| status | Active | |
| tree | JEDEC - Solid State Technology Association:;2007 | |
| contenttype | fulltext | |
| subject keywords | EIA-659 | |
| subject keywords | Failure-Mechanism-Driven | |
| subject keywords | JESD29 | |
| subject keywords | Reliability Monitoring | |
| subject keywords | Statistical Reliability Monitoring - SRM |
