JEDEC JESD24-9

Short Circuit Withstand Time Test Method - Addendum to JEDEC JESD 24

contributor author	JEDEC - Solid State Technology Association
date accessioned	2017-09-04T15:43:21Z
date available	2017-09-04T15:43:21Z
date copyright	08/01/1992 (R 2002)
date issued	2002
identifier other	PLTZJBAAAAAAAAAA.pdf
identifier uri	http://yse.yabesh.ir/std;query=autho4703177/handle/yse/45594
description abstract	Test method to determine how long a device can survive a short circuit condition with a given drive level.
language	English
title	JEDEC JESD24-9	num
title	Short Circuit Withstand Time Test Method - Addendum to JEDEC JESD 24	en
type	standard
page	12
status	Active
tree	JEDEC - Solid State Technology Association:;2002
contenttype	fulltext
subject keywords	Short Circuit Withstand Time
subject keywords	Test Method - Short Circuit Withstand Time
subject keywords	Withstand Time - Short Circuit