BSI BS QC 790101

BSI - British Standards Institution

English -- Semiconductor Devices. Integrated Circuits. Sectional Specification for Semiconductor Integrated Circuits Excluding Hybrid Circuits Section 1: Internal Visual Examination for Semiconductor Integrated Circuits Excluding Hybrid Circuits<br>German -- Halbleiterbauelemente. Integrierte Schaltungen. Interne Sichtpruefung vor dem Verschliessen von integrierten Halbleiterschaltungen mit Ausnahme von Hybr;
French -- Dispositifs a semiconducteurs. Circuits integres. Examen visuel interen pour les circuits integres a semiconducteurs a l'exclusion des circuits hybrides<br>idschaltungen

contributor author	BSI - British Standards Institution
date accessioned	2017-09-04T16:53:52Z
date available	2017-09-04T16:53:52Z
date copyright	1992.08.15
date issued	1992
identifier other	WWZUCAAAAAAAAAAA.pdf
identifier uri	http://yse.yabesh.ir/std;query=autho47037D83081DAC4241668F1E350F130D0Facilities%20Engine/handle/yse/117351
description abstract	Tests to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.
language	English
title	BSI BS QC 790101	num
title	English -- Semiconductor Devices. Integrated Circuits. Sectional Specification for Semiconductor Integrated Circuits Excluding Hybrid Circuits Section 1: Internal Visual Examination for Semiconductor Integrated Circuits Excluding Hybrid Circuits German -- Halbleiterbauelemente. Integrierte Schaltungen. Interne Sichtpruefung vor dem Verschliessen von integrierten Halbleiterschaltungen mit Ausnahme von Hybr	en
title	French -- Dispositifs a semiconducteurs. Circuits integres. Examen visuel interen pour les circuits integres a semiconducteurs a l'exclusion des circuits hybrides idschaltungen	other
type	standard
page	32
status	Active
tree	BSI - British Standards Institution:;1992
contenttype	fulltext
subject keywords	Approval testing
subject keywords	Assessed quality
subject keywords	Defects
subject keywords	Electronic equipment and components
subject keywords	Inspection
subject keywords	Integrated circuits
subject keywords	Internal
subject keywords	Qualification approval
subject keywords	Quality assurance systems
subject keywords	Semiconductor devices
subject keywords	Semiconductor resistors
subject keywords	Specification (approval)
subject keywords	Testing conditions
subject keywords	Visual inspection (testing)