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BSI BS QC 760200

English -- Harmonized System of Quality Assessment for Electronic Components Semiconductor Devices - Integrated Circuits - Sectional Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits on the Basis of the Capability Approval Procedures;
German -- Halbleiterbauelemente - Integrierte Schaltungen. Rahmenspezifikation fuer integrierte Schicht- und Hybridschaltungen auf Grundlage des Befaehigungsanerkennungsverfahrens<br>French -- Dispositifs a semiconducteurs. Circuits integres. Specification intermediaire pour les circuits integres a couches et les circuits integres hybrides a couches sur la base des procedures d'agrement de savoir-faire

contributor authorBSI - British Standards Institution
date accessioned2017-09-04T15:20:12Z
date available2017-09-04T15:20:12Z
date copyright1997.08.15
date issued1997
identifier otherMVQECAAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;query=autho47037D83081DAC4241668F1E350F130D0Facilities%20Engine/handle/yse/20085
description abstractTo be read in conjunction with BS QC 760000:1990
languageEnglish
titleBSI BS QC 760200num
titleEnglish -- Harmonized System of Quality Assessment for Electronic Components Semiconductor Devices - Integrated Circuits - Sectional Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits on the Basis of the Capability Approval Proceduresen
titleGerman -- Halbleiterbauelemente - Integrierte Schaltungen. Rahmenspezifikation fuer integrierte Schicht- und Hybridschaltungen auf Grundlage des Befaehigungsanerkennungsverfahrens
French -- Dispositifs a semiconducteurs. Circuits integres. Specification intermediaire pour les circuits integres a couches et les circuits integres hybrides a couches sur la base des procedures d'agrement de savoir-faire		other
typestandard
page54
statusActive
treeBSI - British Standards Institution:;1997
contenttypefulltext
subject keywordsAcceptance inspection
subject keywordsApproval testing
subject keywordsAssessed quality
subject keywordsCapability approval
subject keywordsCircuits
subject keywordsClassification systems
subject keywordsDamp-heat tests
subject keywordsData layout
subject keywordsDetail specification
subject keywordsDimensions
subject keywordsElectrical testing
subject keywordsElectronic equipment and components
subject keywordsEnvironmental testing
subject keywordsFlow charts
subject keywordsHybrid integrated circuits
subject keywordsInspection
subject keywordsIntegrated circuits
subject keywordsIntegrated film circuits
subject keywordsMaintenance
subject keywordsMass
subject keywordsMechanical testing
subject keywordsPackaging
subject keywordsQualification approval
subject keywordsQuality assurance systems
subject keywordsQuality control
subject keywordsRatings
subject keywordsSampling methods
subject keywordsSemiconductor devices
subject keywordsSolderability testing
subject keywordsSpecification (approval)
subject keywordsStatistical quality control
subject keywordsTesting conditions


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